SurveyIR VS - FT-IR Microspectroscopy Accessory for Analysis of Large, Bulky Specimens


The SurveyIRVSTM is an infrared (IR) microspectroscopy accessory designed to deliver microanalysis capabilities to the widest range of sample sizes and shapes. The SurveyIRVS’s innovative and practical design detaches the stage from the optical microscope. The unique variable stage (VS) design and implementation, permits unmatched analysis of the largest range of specimens in a FT-IR microscope.

Product Note : SurveyIRVSTM FT-IR Microanalysis Accessory for Bulky Samples

Application Areas:


Art Conservation

Quality control



Features and Specifications:

User installed in the FT-IR spectrometer sample compartment

Powered by external computer USB 2.0, +5V DC

5 Mega pixel CMOS color video camera, 2592 x 1944 maximum resolution

Research Grade visual image quality, 1900 µm field of view

2X optical magnification yields 0.7 µm/pixel at sample plane

Reflection and Oblique onboard illumination modes, external flexible LED

IR reflection and diamond attenuated total reflection (ATR) modes available

Simultaneous view/IR collection

Variable fixed diameter IR image mask – 2000, 250, 200, 160, 100, 60 µm’s – controlled via eSpot software

eSpot software control of visual illumination and intensity, IR mask selection and IR collection modes

eSpot software for image capture, storage, and documentation

eSpot software compatible with Windows™ 7, 8, 8.1, and 10

Stage gross height/horizontal adjustment with locking

Stage coarse/fine z adjustment and fine x, y stage adjustment, 1/3” (8.5 mm) minimum working distance, 3.15” (80 mm) maximum x, 1.58” (40 mm) y adjustment

SurveyIR Optical Unit dimensions 3 lbs

Stage controls:      Height adjustment 14”

                                Length adjustment 16”

                                Course/Fine Focus 2.5”