SurveyIR VS - FT-IR Microspectroscopy Accessory for Analysis of Large, Bulky Specimens
The SurveyIRVSTM is an infrared (IR) microspectroscopy accessory designed to deliver microanalysis capabilities to the widest range of sample sizes and shapes. The SurveyIRVS’s innovative and practical design detaches the stage from the optical microscope. The unique variable stage (VS) design and implementation, permits unmatched analysis of the largest range of specimens in a FT-IR microscope.
Product Note : SurveyIRVSTM FT-IR Microanalysis Accessory for Bulky Samples
Application Areas:
Mineralogy
Art Conservation
Quality control
Archeology
Features and Specifications:
User installed in the FT-IR spectrometer sample compartment
Powered by external computer USB 2.0, +5V DC
5 Mega pixel CMOS color video camera, 2592 x 1944 maximum resolution
Research Grade visual image quality, 1900 µm field of view
2X optical magnification yields 0.7 µm/pixel at sample plane
Reflection and Oblique onboard illumination modes, external flexible LED
IR reflection and diamond attenuated total reflection (ATR) modes available
Simultaneous view/IR collection
Variable fixed diameter IR image mask – 2000, 250, 200, 160, 100, 60 µm’s – controlled via eSpot software
eSpot software control of visual illumination and intensity, IR mask selection and IR collection modes
eSpot software for image capture, storage, and documentation
eSpot software compatible with Windows™ 7, 8, 8.1, and 10
Stage gross height/horizontal adjustment with locking
Stage coarse/fine z adjustment and fine x, y stage adjustment, 1/3” (8.5 mm) minimum working distance, 3.15” (80 mm) maximum x, 1.58” (40 mm) y adjustment
SurveyIR Optical Unit dimensions 3 lbs
Stage controls: Height adjustment 14”
Length adjustment 16”
Course/Fine Focus 2.5”